A new approach to structure amplitude determination from 3-beam convergent beam electron diffraction patterns

Research output: Contribution to journalArticleResearchpeer-review

Abstract

The intensity distribution in three-beam CBED patterns from centrosymmetric crystals can be inverted analytically to enable the direct measurement of crystal structure amplitudes and three-phase invariants. The accuracy of the measurements depends upon the accuracy and precision with which specific loci within the discs can be identified. The present work exploits the equivalence in form of the intensity distribution along these loci to provide an algorithm for their automated location, enabling the rapid and unequivocal identification of their position. Moreover, it demonstrates how the loci can be used to determine directly the relative magnitudes of structure amplitudes with superior accuracy and without recourse to complex pattern-matching calculations.
Original languageEnglish
Pages (from-to)841 - 846
Number of pages6
JournalUltramicroscopy
Volume111
Issue number7
DOIs
Publication statusPublished - 2011

Cite this

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title = "A new approach to structure amplitude determination from 3-beam convergent beam electron diffraction patterns",
abstract = "The intensity distribution in three-beam CBED patterns from centrosymmetric crystals can be inverted analytically to enable the direct measurement of crystal structure amplitudes and three-phase invariants. The accuracy of the measurements depends upon the accuracy and precision with which specific loci within the discs can be identified. The present work exploits the equivalence in form of the intensity distribution along these loci to provide an algorithm for their automated location, enabling the rapid and unequivocal identification of their position. Moreover, it demonstrates how the loci can be used to determine directly the relative magnitudes of structure amplitudes with superior accuracy and without recourse to complex pattern-matching calculations.",
author = "Philip Nakashima and Alexander Moodie and Joanne Etheridge",
year = "2011",
doi = "10.1016/j.ultramic.2011.01.044",
language = "English",
volume = "111",
pages = "841 -- 846",
journal = "Ultramicroscopy",
issn = "0304-3991",
publisher = "Elsevier",
number = "7",

}

A new approach to structure amplitude determination from 3-beam convergent beam electron diffraction patterns. / Nakashima, Philip; Moodie, Alexander; Etheridge, Joanne.

In: Ultramicroscopy, Vol. 111, No. 7, 2011, p. 841 - 846.

Research output: Contribution to journalArticleResearchpeer-review

TY - JOUR

T1 - A new approach to structure amplitude determination from 3-beam convergent beam electron diffraction patterns

AU - Nakashima, Philip

AU - Moodie, Alexander

AU - Etheridge, Joanne

PY - 2011

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N2 - The intensity distribution in three-beam CBED patterns from centrosymmetric crystals can be inverted analytically to enable the direct measurement of crystal structure amplitudes and three-phase invariants. The accuracy of the measurements depends upon the accuracy and precision with which specific loci within the discs can be identified. The present work exploits the equivalence in form of the intensity distribution along these loci to provide an algorithm for their automated location, enabling the rapid and unequivocal identification of their position. Moreover, it demonstrates how the loci can be used to determine directly the relative magnitudes of structure amplitudes with superior accuracy and without recourse to complex pattern-matching calculations.

AB - The intensity distribution in three-beam CBED patterns from centrosymmetric crystals can be inverted analytically to enable the direct measurement of crystal structure amplitudes and three-phase invariants. The accuracy of the measurements depends upon the accuracy and precision with which specific loci within the discs can be identified. The present work exploits the equivalence in form of the intensity distribution along these loci to provide an algorithm for their automated location, enabling the rapid and unequivocal identification of their position. Moreover, it demonstrates how the loci can be used to determine directly the relative magnitudes of structure amplitudes with superior accuracy and without recourse to complex pattern-matching calculations.

UR - http://www.elsevier.com/locate/ultramic

U2 - 10.1016/j.ultramic.2011.01.044

DO - 10.1016/j.ultramic.2011.01.044

M3 - Article

VL - 111

SP - 841

EP - 846

JO - Ultramicroscopy

JF - Ultramicroscopy

SN - 0304-3991

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ER -