Abstract
Defect prediction is important in order to reduce test times by allocating valuable test resources effectively. In this work, we propose a model using multivariate approaches in conjunction with Bayesian methods for defect predictions. The motivation behind using a multivariate approach is to overcome the independence assumption of univariate approaches about software attributes. Using Bayesian methods gives practitioners an idea about the defectiveness of software modules in a probabilistic framework rather than the hard classification methods such as decision trees. Furthermore the software attributes used in this work are chosen among the static code attributes that can easily be extracted from source code, which prevents human errors or subjectivity. These attributes are preprocessed with feature selection techniques to select the most relevant attributes for prediction. Finally we compared our proposed model with the best results reported so far on public dataseis and we conclude that using multivariate approaches can perform better.
Original language | English |
---|---|
Title of host publication | Proceedings - 7th International Conference on Quality Software, QSIC 2007 |
Publisher | IEEE, Institute of Electrical and Electronics Engineers |
Pages | 231-237 |
Number of pages | 7 |
ISBN (Print) | 0769530354, 9780769530352 |
DOIs | |
Publication status | Published - 1 Dec 2007 |
Externally published | Yes |
Event | 7th International Conference on Quality Software, QSIC 2007 - Portland, United States of America Duration: 11 Oct 2007 → 12 Oct 2007 |
Conference
Conference | 7th International Conference on Quality Software, QSIC 2007 |
---|---|
Country/Territory | United States of America |
City | Portland |
Period | 11/10/07 → 12/10/07 |
Keywords
- Defect prediction
- Naïve bayes
- Software metrics