A Method to Measure Source Size in Aberration Corrected Electron Microscopes

C. Dwyer, J. Etheridge, R. Erni

Research output: Chapter in Book/Report/Conference proceedingConference PaperOtherpeer-review

Original languageEnglish
Title of host publicationEMC 2008
Subtitle of host publication14th European Microscopy Congress 1–5 September 2008, Aachen, Germany
EditorsMartina Luysberg, Karsten Tillmann, Thomas Weirich
Place of PublicationGermany
PublisherSpringer
Pages19-20
Number of pages2
Volume1
Edition1
ISBN (Electronic)978-3-540-85156-1
ISBN (Print)978-3-540-85154-7
DOIs
Publication statusPublished - 2008
Event14th European Microscopy Congress - Aachen, Germany
Duration: 1 Sep 20085 Sep 2008

Conference

Conference14th European Microscopy Congress
CountryGermany
CityAachen
Period1/09/085/09/08

Keywords

  • coherence
  • STEM
  • Ronchigram

Cite this

Dwyer, C., Etheridge, J., & Erni, R. (2008). A Method to Measure Source Size in Aberration Corrected Electron Microscopes. In M. Luysberg, K. Tillmann, & T. Weirich (Eds.), EMC 2008: 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany (1 ed., Vol. 1, pp. 19-20). Germany: Springer. https://doi.org/10.1007/978-3-540-85156-1
Dwyer, C. ; Etheridge, J. ; Erni, R. / A Method to Measure Source Size in Aberration Corrected Electron Microscopes. EMC 2008: 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany. editor / Martina Luysberg ; Karsten Tillmann ; Thomas Weirich. Vol. 1 1. ed. Germany : Springer, 2008. pp. 19-20
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Dwyer, C, Etheridge, J & Erni, R 2008, A Method to Measure Source Size in Aberration Corrected Electron Microscopes. in M Luysberg, K Tillmann & T Weirich (eds), EMC 2008: 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany. 1 edn, vol. 1, Springer, Germany, pp. 19-20, 14th European Microscopy Congress, Aachen, Germany, 1/09/08. https://doi.org/10.1007/978-3-540-85156-1

A Method to Measure Source Size in Aberration Corrected Electron Microscopes. / Dwyer, C.; Etheridge, J.; Erni, R.

EMC 2008: 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany. ed. / Martina Luysberg; Karsten Tillmann; Thomas Weirich. Vol. 1 1. ed. Germany : Springer, 2008. p. 19-20.

Research output: Chapter in Book/Report/Conference proceedingConference PaperOtherpeer-review

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KW - Ronchigram

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Dwyer C, Etheridge J, Erni R. A Method to Measure Source Size in Aberration Corrected Electron Microscopes. In Luysberg M, Tillmann K, Weirich T, editors, EMC 2008: 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany. 1 ed. Vol. 1. Germany: Springer. 2008. p. 19-20 https://doi.org/10.1007/978-3-540-85156-1