| Original language | English |
|---|---|
| Title of host publication | EMC 2008 |
| Subtitle of host publication | 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany |
| Editors | Martina Luysberg, Karsten Tillmann, Thomas Weirich |
| Place of Publication | Germany |
| Publisher | Springer |
| Pages | 19-20 |
| Number of pages | 2 |
| Volume | 1 |
| Edition | 1 |
| ISBN (Electronic) | 978-3-540-85156-1 |
| ISBN (Print) | 978-3-540-85154-7 |
| DOIs | |
| Publication status | Published - 2008 |
| Event | 14th European Microscopy Congress - Aachen, Germany Duration: 1 Sep 2008 → 5 Sep 2008 |
Conference
| Conference | 14th European Microscopy Congress |
|---|---|
| Country | Germany |
| City | Aachen |
| Period | 1/09/08 → 5/09/08 |
Keywords
- coherence
- STEM
- Ronchigram
Cite this
Dwyer, C., Etheridge, J., & Erni, R. (2008). A Method to Measure Source Size in Aberration Corrected Electron Microscopes. In M. Luysberg, K. Tillmann, & T. Weirich (Eds.), EMC 2008: 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany (1 ed., Vol. 1, pp. 19-20). Germany: Springer. https://doi.org/10.1007/978-3-540-85156-1
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title = "A Method to Measure Source Size in Aberration Corrected Electron Microscopes",
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year = "2008",
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language = "English",
isbn = "978-3-540-85154-7",
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Dwyer, C, Etheridge, J & Erni, R 2008, A Method to Measure Source Size in Aberration Corrected Electron Microscopes. in M Luysberg, K Tillmann & T Weirich (eds), EMC 2008: 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany. 1 edn, vol. 1, Springer, Germany, pp. 19-20, 14th European Microscopy Congress, Aachen, Germany, 1/09/08. https://doi.org/10.1007/978-3-540-85156-1
A Method to Measure Source Size in Aberration Corrected Electron Microscopes. / Dwyer, C.; Etheridge, J.; Erni, R.
EMC 2008: 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany. ed. / Martina Luysberg; Karsten Tillmann; Thomas Weirich. Vol. 1 1. ed. Germany : Springer, 2008. p. 19-20.Research output: Chapter in Book/Report/Conference proceeding › Conference Paper › Other › peer-review
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T1 - A Method to Measure Source Size in Aberration Corrected Electron Microscopes
AU - Dwyer, C.
AU - Etheridge, J.
AU - Erni, R.
PY - 2008
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KW - coherence
KW - STEM
KW - Ronchigram
UR - http://link.springer.com/chapter/10.1007%2F978-3-540-85156-1_10
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SN - 978-3-540-85154-7
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A2 - Luysberg, Martina
A2 - Tillmann, Karsten
A2 - Weirich, Thomas
PB - Springer
CY - Germany
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Dwyer C, Etheridge J, Erni R. A Method to Measure Source Size in Aberration Corrected Electron Microscopes. In Luysberg M, Tillmann K, Weirich T, editors, EMC 2008: 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany. 1 ed. Vol. 1. Germany: Springer. 2008. p. 19-20 https://doi.org/10.1007/978-3-540-85156-1