A Method to Measure Source Size in Aberration Corrected Electron Microscopes

C. Dwyer; J. Etheridge; R. Erni

doi:10.1007/978-3-540-85156-1

A Method to Measure Source Size in Aberration Corrected Electron Microscopes

C. Dwyer, J. Etheridge, R. Erni

Research output: Chapter in Book/Report/Conference proceeding › Conference Paper › Other › peer-review

Original language	English
Title of host publication	EMC 2008
Subtitle of host publication	14th European Microscopy Congress 1–5 September 2008, Aachen, Germany
Editors	Martina Luysberg, Karsten Tillmann, Thomas Weirich
Place of Publication	Germany
Publisher	Springer
Pages	19-20
Number of pages	2
Volume	1
Edition	1
ISBN (Electronic)	978-3-540-85156-1
ISBN (Print)	978-3-540-85154-7
DOIs	https://doi.org/10.1007/978-3-540-85156-1
Publication status	Published - 2008
Event	14th European Microscopy Congress - Aachen, Germany Duration: 1 Sep 2008 → 5 Sep 2008

Conference

Conference	14th European Microscopy Congress
Country	Germany
City	Aachen
Period	1/09/08 → 5/09/08

Keywords

coherence
STEM
Ronchigram

Access to Document

10.1007/978-3-540-85156-1

http://link.springer.com/chapter/10.1007%2F978-3-540-85156-1_10

Centre for Electron Microscopy (MCEM)
Peter Miller (Manager)
Office of the Vice-Provost (Research and Research Infrastructure)
Facility/equipment: Facility

Cite this

@inproceedings{5802bd56502d4862b118d66fa2eefe8d,

title = "A Method to Measure Source Size in Aberration Corrected Electron Microscopes",

keywords = "coherence , STEM , Ronchigram",

author = "C. Dwyer and J. Etheridge and R. Erni",

year = "2008",

doi = "10.1007/978-3-540-85156-1",

language = "English",

isbn = "978-3-540-85154-7",

volume = "1",

pages = "19--20",

editor = "Luysberg, {Martina } and Tillmann, {Karsten } and Weirich, {Thomas }",

booktitle = "EMC 2008",

publisher = "Springer",

edition = "1",

note = "14th European Microscopy Congress ; Conference date: 01-09-2008 Through 05-09-2008",

}

Dwyer, C, Etheridge, J & Erni, R 2008, A Method to Measure Source Size in Aberration Corrected Electron Microscopes. in M Luysberg, K Tillmann & T Weirich (eds), EMC 2008: 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany. 1 edn, vol. 1, Springer, Germany, pp. 19-20, 14th European Microscopy Congress, Aachen, Germany, 1/09/08. https://doi.org/10.1007/978-3-540-85156-1

A Method to Measure Source Size in Aberration Corrected Electron Microscopes. / Dwyer, C.; Etheridge, J.; Erni, R.

EMC 2008: 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany. ed. / Martina Luysberg; Karsten Tillmann; Thomas Weirich. Vol. 1 1. ed. Germany : Springer, 2008. p. 19-20.

Research output: Chapter in Book/Report/Conference proceeding › Conference Paper › Other › peer-review

TY - GEN

T1 - A Method to Measure Source Size in Aberration Corrected Electron Microscopes

AU - Dwyer, C.

AU - Etheridge, J.

AU - Erni, R.

PY - 2008

Y1 - 2008

KW - coherence

KW - STEM

KW - Ronchigram

UR - http://link.springer.com/chapter/10.1007%2F978-3-540-85156-1_10

U2 - 10.1007/978-3-540-85156-1

DO - 10.1007/978-3-540-85156-1

M3 - Conference Paper

SN - 978-3-540-85154-7

VL - 1

SP - 19

EP - 20

BT - EMC 2008

A2 - Luysberg, Martina

A2 - Tillmann, Karsten

A2 - Weirich, Thomas

PB - Springer

CY - Germany

T2 - 14th European Microscopy Congress

Y2 - 1 September 2008 through 5 September 2008

ER -

A Method to Measure Source Size in Aberration Corrected Electron Microscopes

Conference

Keywords

Access to Document

Centre for Electron Microscopy (MCEM)

Cite this