A menu of electron probes for optimising information from scanning transmission electron microscopy

Research output: Research - peer-reviewArticle

Abstract

We assess a selection of electron probes in terms of the spatial resolution with which information can be derived about the structure of a specimen, as opposed to the nominal image resolution. Using Ge [001] as a study case, we investigate the scattering dynamics of these probes and determine their relative merits in terms of two qualitative criteria: interaction volume and interpretability. This analysis provides a ‘menu of probes’ from which an optimum probe for tackling a given materials science question can be selected. Hollow cone, vortex and spherical wave fronts are considered, from unit cell to Angstrom size, and for different defocus and specimen orientations.
LanguageEnglish
Pages143-155
Number of pages13
JournalUltramicroscopy
Volume184
Issue numberPart A
DOIs
StatePublished - 2018

Keywords

  • ADF-STEM
  • Information resolution
  • Interpretability
  • Electron probe
  • Channelling

Cite this

@article{74983deb66054948976578eca2157f71,
title = "A menu of electron probes for optimising information from scanning transmission electron microscopy",
abstract = "We assess a selection of electron probes in terms of the spatial resolution with which information can be derived about the structure of a specimen, as opposed to the nominal image resolution. Using Ge [001] as a study case, we investigate the scattering dynamics of these probes and determine their relative merits in terms of two qualitative criteria: interaction volume and interpretability. This analysis provides a ‘menu of probes’ from which an optimum probe for tackling a given materials science question can be selected. Hollow cone, vortex and spherical wave fronts are considered, from unit cell to Angstrom size, and for different defocus and specimen orientations.",
keywords = "ADF-STEM, Information resolution, Interpretability, Electron probe, Channelling",
author = "Nguyen, {D. T.} and Findlay, {S. D.} and J. Etheridge",
year = "2018",
doi = "10.1016/j.ultramic.2017.08.020",
volume = "184",
pages = "143--155",
journal = "Ultramicroscopy",
issn = "0304-3991",
publisher = "Elsevier",
number = "Part A",

}

A menu of electron probes for optimising information from scanning transmission electron microscopy. / Nguyen, D. T.; Findlay, S. D.; Etheridge, J.

In: Ultramicroscopy, Vol. 184, No. Part A, 2018, p. 143-155.

Research output: Research - peer-reviewArticle

TY - JOUR

T1 - A menu of electron probes for optimising information from scanning transmission electron microscopy

AU - Nguyen,D. T.

AU - Findlay,S. D.

AU - Etheridge,J.

PY - 2018

Y1 - 2018

N2 - We assess a selection of electron probes in terms of the spatial resolution with which information can be derived about the structure of a specimen, as opposed to the nominal image resolution. Using Ge [001] as a study case, we investigate the scattering dynamics of these probes and determine their relative merits in terms of two qualitative criteria: interaction volume and interpretability. This analysis provides a ‘menu of probes’ from which an optimum probe for tackling a given materials science question can be selected. Hollow cone, vortex and spherical wave fronts are considered, from unit cell to Angstrom size, and for different defocus and specimen orientations.

AB - We assess a selection of electron probes in terms of the spatial resolution with which information can be derived about the structure of a specimen, as opposed to the nominal image resolution. Using Ge [001] as a study case, we investigate the scattering dynamics of these probes and determine their relative merits in terms of two qualitative criteria: interaction volume and interpretability. This analysis provides a ‘menu of probes’ from which an optimum probe for tackling a given materials science question can be selected. Hollow cone, vortex and spherical wave fronts are considered, from unit cell to Angstrom size, and for different defocus and specimen orientations.

KW - ADF-STEM

KW - Information resolution

KW - Interpretability

KW - Electron probe

KW - Channelling

UR - http://www.scopus.com/inward/record.url?scp=85028957545&partnerID=8YFLogxK

U2 - 10.1016/j.ultramic.2017.08.020

DO - 10.1016/j.ultramic.2017.08.020

M3 - Article

VL - 184

SP - 143

EP - 155

JO - Ultramicroscopy

T2 - Ultramicroscopy

JF - Ultramicroscopy

SN - 0304-3991

IS - Part A

ER -