A knowledge-rich similarity measure for improving IT incident resolution process

Yong Bin Kang, Arkady Zaslavsky, Shonali Krishnaswamy, Claudio Bartolini

    Research output: Chapter in Book/Report/Conference proceedingConference PaperResearchpeer-review

    10 Citations (Scopus)
    Original languageEnglish
    Title of host publicationProceedings of the 2010 ACM Symposium on Applied Computing
    EditorsDongwan Shin
    Place of PublicationNew York NY USA
    PublisherAssociation for Computing Machinery (ACM)
    Pages1781 - 1788
    Number of pages8
    ISBN (Print)9781605586380
    Publication statusPublished - 2010
    EventACM Symposium on Applied Computing 2010 - Sierre , Switzerland
    Duration: 22 Mar 201026 Mar 2010
    https://dl.acm.org/citation.cfm?id=1774088 (ACM Digital Library Proceedings)

    Conference

    ConferenceACM Symposium on Applied Computing 2010
    Abbreviated titleSAC 2010
    CountrySwitzerland
    CitySierre
    Period22/03/1026/03/10
    Internet address

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