A knowledge-rich similarity measure for improving IT incident resolution process

Yong Bin Kang, Arkady Zaslavsky, Shonali Krishnaswamy, Claudio Bartolini

Research output: Chapter in Book/Report/Conference proceeding › Conference Paper › Research › peer-review

Original language	English
Title of host publication	Proceedings of the 2010 ACM Symposium on Applied Computing
Editors	Dongwan Shin
Place of Publication	New York NY USA
Publisher	Association for Computing Machinery (ACM)
Pages	1781 - 1788
Number of pages	8
ISBN (Print)	9781605586380
Publication status	Published - 2010
Event	ACM Symposium on Applied Computing 2010 - Sierre , Switzerland Duration: 22 Mar 2010 → 26 Mar 2010 Conference number: 25th https://dl.acm.org/citation.cfm?id=1774088 (ACM Digital Library Proceedings)

Conference	ACM Symposium on Applied Computing 2010
Abbreviated title	SAC 2010
Country/Territory	Switzerland
City	Sierre
Period	22/03/10 → 26/03/10
Internet address	https://dl.acm.org/citation.cfm?id=1774088 (ACM Digital Library Proceedings)

Cite this

@inproceedings{a70b31a98f0b49eb9ae5b48d810acccf,

title = "A knowledge-rich similarity measure for improving IT incident resolution process",

author = "Kang, {Yong Bin} and Arkady Zaslavsky and Shonali Krishnaswamy and Claudio Bartolini",

year = "2010",

language = "English",

isbn = "9781605586380",

pages = "1781 -- 1788",

editor = "Dongwan Shin",

booktitle = "Proceedings of the 2010 ACM Symposium on Applied Computing",

publisher = "Association for Computing Machinery (ACM)",

address = "United States of America",

note = "ACM Symposium on Applied Computing 2010, SAC 2010 ; Conference date: 22-03-2010 Through 26-03-2010",

url = "https://dl.acm.org/citation.cfm?id=1774088",

}

A knowledge-rich similarity measure for improving IT incident resolution process. / Kang, Yong Bin; Zaslavsky, Arkady; Krishnaswamy, Shonali et al.
Proceedings of the 2010 ACM Symposium on Applied Computing. ed. / Dongwan Shin. New York NY USA: Association for Computing Machinery (ACM), 2010. p. 1781 - 1788.

Research output: Chapter in Book/Report/Conference proceeding › Conference Paper › Research › peer-review

TY - GEN

T1 - A knowledge-rich similarity measure for improving IT incident resolution process

AU - Kang, Yong Bin

AU - Zaslavsky, Arkady

AU - Krishnaswamy, Shonali

AU - Bartolini, Claudio

N1 - Conference code: 25th

PY - 2010

Y1 - 2010

M3 - Conference Paper

SN - 9781605586380

SP - 1781

EP - 1788

BT - Proceedings of the 2010 ACM Symposium on Applied Computing

A2 - Shin, Dongwan

PB - Association for Computing Machinery (ACM)

CY - New York NY USA

T2 - ACM Symposium on Applied Computing 2010

Y2 - 22 March 2010 through 26 March 2010

ER -