A comparison of EDS microanalysis in FIB-prepared and electropolished TEM thin foils

Christopher Hutchinson, Robert E Hackenberg, Gary J Shiflet

Research output: Contribution to journalArticleResearchpeer-review

30 Citations (Scopus)
Original languageEnglish
Pages (from-to)37 - 48
Number of pages12
JournalUltramicroscopy
Volume94
Issue number1
Publication statusPublished - 2003

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