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A comparative study of electronic properties of the defects introduced in p-Si: (i) During electron beam deposition of Ti/Mo, (ii) by proton irradiation, and (iii) by electron irradiation

  • A G M Das
  • , Cloud Nyamhere
  • , F D Auret
  • , M Hayes

    Research output: Contribution to journalArticleResearchpeer-review

    Original languageEnglish
    Pages (from-to)2628 - 2631
    Number of pages4
    JournalSurface and Coatings Technology
    Volume203
    Issue number17-18
    Publication statusPublished - 2009

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