A comparative study of electronic properties of the defects introduced in p-Si: (i) During electron beam deposition of Ti/Mo, (ii) by proton irradiation, and (iii) by electron irradiation

A G M Das, Cloud Nyamhere, F D Auret, M Hayes

    Research output: Contribution to journalArticleResearchpeer-review

    4 Citations (Scopus)
    Original languageEnglish
    Pages (from-to)2628 - 2631
    Number of pages4
    JournalSurface and Coatings Technology
    Issue number17-18
    Publication statusPublished - 2009

    Cite this