Original language | English |
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Pages (from-to) | 2628 - 2631 |
Number of pages | 4 |
Journal | Surface and Coatings Technology |
Volume | 203 |
Issue number | 17-18 |
Publication status | Published - 2009 |
A comparative study of electronic properties of the defects introduced in p-Si: (i) During electron beam deposition of Ti/Mo, (ii) by proton irradiation, and (iii) by electron irradiation
A G M Das, Cloud Nyamhere, F D Auret, M Hayes
Research output: Contribution to journal › Article › Research › peer-review
4
Citations
(Scopus)