A comparative EBSD and micro-XRD study of the intergranular grain structure in CP-Ti

Peter A Lynch, D. Tomus, C. J. Bettles, M. A. Gibson, A. W. Stevenson

    Research output: Contribution to journalArticleResearchpeer-review

    Abstract

    Electron Backscatter Diffraction (EBSD) and scanning polychromatic X-ray micro-diffraction (micro-XRD) have been applied to study the intergranular grain structure in CP-Ti strip. Prior to synchrotron experimentation, a polycrystalline CP-Ti sample was electrochemically polished and a series of fiducial markers were placed on the surface to define a 500 μm × 500 μm region of interest. Within this area EBSD was used to obtain an orientation map of the grains at the sample surface. Synchrotron polychromatic X-ray micro-diffraction data, collected on beamline 12.3.2 at the Advanced Light Source, was then used to map an area of 200 × 60 μm2 within the region of interest. Comparison of the respective grain maps indicated an average grain size of ̃50 mm. Micro-XRD data was initially used to locate the same surface grains determined by EBSD. Based on comparison of the Euler angles, grain orientation maps from the two data sets were found to be in close agreement. The typical rolling texture found in CP-Ti was identified with the basal pole maxima tilted slightly toward the transverse direction. Subsequent 3D analysis of the Laue pattern intensity distribution of the surface grains revealed that some of the large grains identified by EBSD formed sub-cell structures below the sample surface. 

    Original languageEnglish
    Pages (from-to)298-301
    Number of pages4
    JournalNuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors, and Associated Equipment
    Volume619
    Issue number1-3
    DOIs
    Publication statusPublished - 1 Jul 2010

    Keywords

    • EBSD
    • Synchrotron micro diffraction
    • Titanium

    Cite this

    @article{875bcd6f4d44435d88c7a600a9345024,
    title = "A comparative EBSD and micro-XRD study of the intergranular grain structure in CP-Ti",
    abstract = "Electron Backscatter Diffraction (EBSD) and scanning polychromatic X-ray micro-diffraction (micro-XRD) have been applied to study the intergranular grain structure in CP-Ti strip. Prior to synchrotron experimentation, a polycrystalline CP-Ti sample was electrochemically polished and a series of fiducial markers were placed on the surface to define a 500 μm × 500 μm region of interest. Within this area EBSD was used to obtain an orientation map of the grains at the sample surface. Synchrotron polychromatic X-ray micro-diffraction data, collected on beamline 12.3.2 at the Advanced Light Source, was then used to map an area of 200 × 60 μm2 within the region of interest. Comparison of the respective grain maps indicated an average grain size of ̃50 mm. Micro-XRD data was initially used to locate the same surface grains determined by EBSD. Based on comparison of the Euler angles, grain orientation maps from the two data sets were found to be in close agreement. The typical rolling texture found in CP-Ti was identified with the basal pole maxima tilted slightly toward the transverse direction. Subsequent 3D analysis of the Laue pattern intensity distribution of the surface grains revealed that some of the large grains identified by EBSD formed sub-cell structures below the sample surface. ",
    keywords = "EBSD, Synchrotron micro diffraction, Titanium",
    author = "Lynch, {Peter A} and D. Tomus and Bettles, {C. J.} and Gibson, {M. A.} and Stevenson, {A. W.}",
    year = "2010",
    month = "7",
    day = "1",
    doi = "10.1016/j.nima.2009.12.005",
    language = "English",
    volume = "619",
    pages = "298--301",
    journal = "Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors, and Associated Equipment",
    issn = "0168-9002",
    publisher = "Elsevier",
    number = "1-3",

    }

    A comparative EBSD and micro-XRD study of the intergranular grain structure in CP-Ti. / Lynch, Peter A; Tomus, D.; Bettles, C. J.; Gibson, M. A. ; Stevenson, A. W.

    In: Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors, and Associated Equipment, Vol. 619, No. 1-3, 01.07.2010, p. 298-301.

    Research output: Contribution to journalArticleResearchpeer-review

    TY - JOUR

    T1 - A comparative EBSD and micro-XRD study of the intergranular grain structure in CP-Ti

    AU - Lynch, Peter A

    AU - Tomus, D.

    AU - Bettles, C. J.

    AU - Gibson, M. A.

    AU - Stevenson, A. W.

    PY - 2010/7/1

    Y1 - 2010/7/1

    N2 - Electron Backscatter Diffraction (EBSD) and scanning polychromatic X-ray micro-diffraction (micro-XRD) have been applied to study the intergranular grain structure in CP-Ti strip. Prior to synchrotron experimentation, a polycrystalline CP-Ti sample was electrochemically polished and a series of fiducial markers were placed on the surface to define a 500 μm × 500 μm region of interest. Within this area EBSD was used to obtain an orientation map of the grains at the sample surface. Synchrotron polychromatic X-ray micro-diffraction data, collected on beamline 12.3.2 at the Advanced Light Source, was then used to map an area of 200 × 60 μm2 within the region of interest. Comparison of the respective grain maps indicated an average grain size of ̃50 mm. Micro-XRD data was initially used to locate the same surface grains determined by EBSD. Based on comparison of the Euler angles, grain orientation maps from the two data sets were found to be in close agreement. The typical rolling texture found in CP-Ti was identified with the basal pole maxima tilted slightly toward the transverse direction. Subsequent 3D analysis of the Laue pattern intensity distribution of the surface grains revealed that some of the large grains identified by EBSD formed sub-cell structures below the sample surface. 

    AB - Electron Backscatter Diffraction (EBSD) and scanning polychromatic X-ray micro-diffraction (micro-XRD) have been applied to study the intergranular grain structure in CP-Ti strip. Prior to synchrotron experimentation, a polycrystalline CP-Ti sample was electrochemically polished and a series of fiducial markers were placed on the surface to define a 500 μm × 500 μm region of interest. Within this area EBSD was used to obtain an orientation map of the grains at the sample surface. Synchrotron polychromatic X-ray micro-diffraction data, collected on beamline 12.3.2 at the Advanced Light Source, was then used to map an area of 200 × 60 μm2 within the region of interest. Comparison of the respective grain maps indicated an average grain size of ̃50 mm. Micro-XRD data was initially used to locate the same surface grains determined by EBSD. Based on comparison of the Euler angles, grain orientation maps from the two data sets were found to be in close agreement. The typical rolling texture found in CP-Ti was identified with the basal pole maxima tilted slightly toward the transverse direction. Subsequent 3D analysis of the Laue pattern intensity distribution of the surface grains revealed that some of the large grains identified by EBSD formed sub-cell structures below the sample surface. 

    KW - EBSD

    KW - Synchrotron micro diffraction

    KW - Titanium

    UR - http://www.scopus.com/inward/record.url?scp=78650302072&partnerID=8YFLogxK

    U2 - 10.1016/j.nima.2009.12.005

    DO - 10.1016/j.nima.2009.12.005

    M3 - Article

    VL - 619

    SP - 298

    EP - 301

    JO - Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors, and Associated Equipment

    JF - Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors, and Associated Equipment

    SN - 0168-9002

    IS - 1-3

    ER -