A combination methods of charge density measurement in hard materials using accurate, quantitative electron and X-ray diffraction: The -AI2O3 case

Victor A Streltsov; Philip Nakashima; Andrew W S Johnson

A combination methods of charge density measurement in hard materials using accurate, quantitative electron and X-ray diffraction: The -AI2O3 case

Victor A Streltsov, Philip Nakashima, Andrew W S Johnson

Monash Centre for Electron Microscopy

Research output: Contribution to journal › Article › Research › peer-review

Original language	English
Pages (from-to)	419 - 427
Number of pages	9
Journal	Microscopy and Microanalysis
Volume	9
Issue number	5
Publication status	Published - 2003

Cite this

@article{9a25d90f0f56442081d7a473cf03c9b0,

title = "A combination methods of charge density measurement in hard materials using accurate, quantitative electron and X-ray diffraction: The -AI2O3 case",

author = "Streltsov, {Victor A} and Philip Nakashima and Johnson, {Andrew W S}",

year = "2003",

language = "English",

volume = "9",

pages = "419 -- 427",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Cambridge University Press",

number = "5",

}

TY - JOUR

T1 - A combination methods of charge density measurement in hard materials using accurate, quantitative electron and X-ray diffraction: The -AI2O3 case

AU - Streltsov, Victor A

AU - Nakashima, Philip

AU - Johnson, Andrew W S

PY - 2003

Y1 - 2003

M3 - Article

SN - 1431-9276

VL - 9

SP - 419

EP - 427

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - 5

ER -