A combination methods of charge density measurement in hard materials using accurate, quantitative electron and X-ray diffraction: The -AI2O3 case

Victor A Streltsov, Philip Nakashima, Andrew W S Johnson

Research output: Contribution to journalArticleResearchpeer-review

Original languageEnglish
Pages (from-to)419 - 427
Number of pages9
JournalMicroscopy and Microanalysis
Issue number5
Publication statusPublished - 2003

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