3D Tomography for Multiple-scattering Samples Using Phase Contrast Electron Microscopy

David Ren; Colin Ophus; Jihan Zhou; Hannah Devyldere; Michael Whittaker; Benjamin Gilbert; Jillian Banfield; Mary Scott; Jianwei Miao; Laura Waller

doi:10.1017/S1431927620016372

3D Tomography for Multiple-scattering Samples Using Phase Contrast Electron Microscopy

David Ren, Colin Ophus, Jihan Zhou, Hannah Devyldere, Michael Whittaker, Benjamin Gilbert, Jillian Banfield, Mary Scott, Jianwei Miao, Laura Waller

Research output: Contribution to journal › Meeting Abstract › peer-review

Original language	English
Article number	365
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	26
Issue number	S2
DOIs	https://doi.org/10.1017/S1431927620016372
Publication status	Published - Aug 2020
Externally published	Yes

Access to Document

10.1017/S1431927620016372

Cite this

@article{5f30d1051eed44daaf8704e85eb20b5e,

title = "3D Tomography for Multiple-scattering Samples Using Phase Contrast Electron Microscopy",

author = "David Ren and Colin Ophus and Jihan Zhou and Hannah Devyldere and Michael Whittaker and Benjamin Gilbert and Jillian Banfield and Mary Scott and Jianwei Miao and Laura Waller",

year = "2020",

month = aug,

doi = "10.1017/S1431927620016372",

language = "English",

volume = "26",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Cambridge University Press",

number = "S2",

}

TY - JOUR

T1 - 3D Tomography for Multiple-scattering Samples Using Phase Contrast Electron Microscopy

AU - Ren, David

AU - Ophus, Colin

AU - Zhou, Jihan

AU - Devyldere, Hannah

AU - Whittaker, Michael

AU - Gilbert, Benjamin

AU - Banfield, Jillian

AU - Scott, Mary

AU - Miao, Jianwei

AU - Waller, Laura

PY - 2020/8

Y1 - 2020/8

UR - http://www.scopus.com/inward/record.url?scp=85091848543&partnerID=8YFLogxK

U2 - 10.1017/S1431927620016372

DO - 10.1017/S1431927620016372

M3 - Meeting Abstract

AN - SCOPUS:85091848543

SN - 1431-9276

VL - 26

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - S2

M1 - 365

ER -

3D Tomography for Multiple-scattering Samples Using Phase Contrast Electron Microscopy

Access to Document

Other files and links

Cite this