3-D analysis of nanomaterials using electron tomography

P. A. Midgley, M. Weyland, R. Dunin-Borkowski, L. Laffont, John Meurig Thomas, T. Yates

Research output: Contribution to journalMeeting Abstractpeer-review

2 Citations (Scopus)
Original languageEnglish
Pages (from-to)4-5
Number of pages2
JournalMicroscopy and Microanalysis
Issue numberSUPPL. 2
Publication statusPublished - 4 Sept 2003
Externally publishedYes

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