3-D analysis of nanomaterials using electron tomography

P. A. Midgley, M. Weyland, R. Dunin-Borkowski, L. Laffont, John Meurig Thomas, T. Yates

Research output: Contribution to journal › Meeting Abstract › peer-review

Original language	English
Pages (from-to)	4-5
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	9
Issue number	SUPPL. 2
Publication status	Published - 4 Sept 2003
Externally published	Yes

Cite this

@article{ef669422e4ee40e3b639c8049ec9dd6a,

title = "3-D analysis of nanomaterials using electron tomography",

author = "Midgley, {P. A.} and M. Weyland and R. Dunin-Borkowski and L. Laffont and Thomas, {John Meurig} and T. Yates",

year = "2003",

month = sep,

day = "4",

language = "English",

volume = "9",

pages = "4--5",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Cambridge University Press",

number = "SUPPL. 2",

}

TY - JOUR

T1 - 3-D analysis of nanomaterials using electron tomography

AU - Midgley, P. A.

AU - Weyland, M.

AU - Dunin-Borkowski, R.

AU - Laffont, L.

AU - Thomas, John Meurig

AU - Yates, T.

PY - 2003/9/4

Y1 - 2003/9/4

UR - http://www.scopus.com/inward/record.url?scp=0041923777&partnerID=8YFLogxK

M3 - Meeting Abstract

AN - SCOPUS:0041923777

SN - 1431-9276

VL - 9

SP - 4

EP - 5

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - SUPPL. 2

ER -