Deep Learning-Enhanced Image Segmentation for Micro-Scale Defect Detection in Printed Circuit Boards (PCBs)

  • Chee Keong, Tan (Primary Chief Investigator (PCI))
  • Lin, Horng Sheng (Partner Investigator (PI))
  • Puah, Eddie (Partner Investigator (PI))
  • Chong, Lee Wai (Partner Investigator (PI))

Project: Research

Project Details

StatusActive
Effective start/end date1/09/23 → 28/02/27

Keywords

  • deep learning
  • image segmentation
  • printed circuit board (PCB)