A Method to Characterise an Aberration-Corrected Electron Wave Field - a step towards quantitative electron microscopy

This project will develop a method that will enable, for the first time, the measurement of the properties of a beam of electrons in a transmission electron microscope. This will enable the development of new and unique capabilities for determining the local atomic structure and bonding of materials, particularly complex nanostructured materials. This method will be developed on one of the world's highest resolution microscopes, located at Monash University, with the unique expertise of FEI Company's leading electron-optical physicists. It will further extend the capability of this multi-million dollar instrument, enabling Australian researchers to solve otherwise intractable problems in materials science and engineering.