Personal profile


Senior Lecturer, School of Physics and Astronomy, Monash University, 2016-present.

QEII Fellow, School of Physics and Astronomy, Monash University, 2011-2016.

Principal Researcher, The University of Tokyo, 2010-2011.

Japan Society for the Promotion of Science Reserach Fellow, The University of Tokyo, 2007-2009.

Post-doctoral Research Fellow, The University of Melbourne, 2005-2007.

PhD (Physics), Complete 2005, The University of Melbourne

BSc (Hons), Physics, Completed 2001, The University of Melbourne.

Research interests

Scott's research interests centre around developing techniques for atomic resolution imaging of materials in transmission electron microscopy and scanning transmission electron microscopy.

Using theoretical modelling and numerical simulation to analyse the elastic and inelastic scattering behaviour of fast electrons moving through solids, I work closely with experimental collaborators to tease out the maximum of scientific information from experimental microscopy images.

Topics of current interest include:

  • Using segmented and pixel detector geometries to form novel and useful imaging modes.
  • Measuring the shape and composition of materials at the nanoscale by using absolute-scale comparisons between experimental data and simulated images.
  • Developing the recent technique of annular bright field imaging for the direct imaging of light elements using scanning transmission electron microscopy.

Monash teaching commitment

Level 2 Physics Chief Examiner

Unit Coordinator for PHS2061, PHS2081 and PHS2062

Lectuerer into PHS2081 and PHS3042


  • Atomic resolution imaging
  • Electron Microscopy
  • Theoretical Physics

Network Recent external collaboration on country level. Dive into details by clicking on the dots.

Projects 2011 2019

Research Output 2005 2018

A menu of electron probes for optimising information from scanning transmission electron microscopy

Nguyen, D. T., Findlay, S. D. & Etheridge, J. 2018 In : Ultramicroscopy. 184, Part A, p. 143-155 13 p.

Research output: Research - peer-reviewArticle

Accuracy and precision of thickness determination from position-averaged convergent beam electron diffraction patterns using a single-parameter metric

Pollock, J. A., Weyland, M., Taplin, D. J., Allen, L. J. & Findlay, S. D. 1 Oct 2017 In : Ultramicroscopy. 181, p. 86-96 11 p.

Research output: Research - peer-reviewArticle

Direct Visualization of Local Electromagnetic Field Structures by Scanning Transmission Electron Microscopy

Shibata, N., Findlay, S. D., Matsumoto, T., Kohno, Y., Seki, T., Sánchez-Santolino, G. & Ikuhara, Y. 18 Jul 2017 In : Accounts of Chemical Research. 50, 7, p. 1502-1512 11 p.

Research output: Research - peer-reviewArticle

Electric field imaging of single atoms

Shibata, N., Seki, T., Sánchez-Santolino, G., Findlay, S., Kohno, Y., Matsumoto, T., Ishikawa, R. & Ikuhara, Y. 30 May 2017 In : Nature Communications. 8, 15631

Research output: Research - peer-reviewArticle