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Research Output 2004 2016

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Conference Paper
2015

An empirical investigation of personality traits of software testers

Kanij, T., Merkel, R. G. & Grundy, J., 2015, Eighth International Workshop on Cooperative and Human Aspects of Software Engineering (CHASE 2015). Begel, A., Prikladnicki, R., Dittrich, Y., de Souza, C., Sarma, A. & Athavale, S. (eds.). Piscataway NJ USA: IEEE, Institute of Electrical and Electronics Engineers, p. 1 - 7 7 p.

Research output: Chapter in Book/Report/Conference proceedingConference PaperResearchpeer-review

2014

An empirical study to review and revise job responsibilities of software testers

Kanij, T., Merkel, R. G. & Grundy, J., 2014, Proceedings 2014 IEEE Symposium on Visual Languages and Human-Centric Computing (VL/HCC 2014). Fleming, S. D., Fish, A. & Scaffidi, C. (eds.). Piscataway NJ USA: IEEE, Institute of Electrical and Electronics Engineers, p. 89 - 92 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference PaperResearchpeer-review

A preliminary survey of factors affecting software testers

Kanij, T., Merkel, R. G. & Grundy, J., 2014, 23rd Australasian Software Engineering Conference (ASWEC 2014). Steel, J. & Zhu, L. (eds.). Los Alamitos CA USA: IEEE Computer Society, p. 180 - 189 10 p.

Research output: Chapter in Book/Report/Conference proceedingConference PaperResearchpeer-review

The effect of method origin on method invocation fault frequency

Nath, S. K., Merkel, R. & Lau, M. F., 2014, Proceedings of the 14th International Conference on Quality Software (QSIC 2014). McMillin, B. (ed.). Los Alamitos CA USA: IEEE Computer Society, p. 212 - 221 10 p.

Research output: Chapter in Book/Report/Conference proceedingConference PaperResearchpeer-review

2013

An empirical study of the effects of personality on software testing

Kanij, T., Merkel, R. G. & Grundy, J., 2013, 2013 26th International Conference on Software Engineering Education and Training (CSEE&T) Proceedings. Cowlng, T. & Bohner, S. (eds.). Piscataway NJ USA: IEEE, Institute of Electrical and Electronics Engineers, p. 239 - 248 10 p.

Research output: Chapter in Book/Report/Conference proceedingConference PaperResearchpeer-review

Lessons learned from conducting industry surveys in software testing

Kanij, T., Merkel, R. G. & Grundy, J., 2013, Proceedings of the 35th International Conference on Software Engineering (ISCE 2013). Curtis, B., Franch, X., Madhavji, N. H. & Votta, L. (eds.). Piscataway NJ USA: IEEE, Institute of Electrical and Electronics Engineers, p. 63 - 66 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference PaperResearchpeer-review

2012

On the improvement of a fault classification scheme with implications for white-box testing

Nath, S. K., Merkel, R. G. & Lau, M. F., 2012, Proceedings of the 27th Annual ACM Symposium on Applied Computing. Shin, D. (ed.). New York NY USA: Association for Computing Machinery (ACM), p. 1123 - 1130 8 p.

Research output: Chapter in Book/Report/Conference proceedingConference PaperResearchpeer-review

Performance assessment metrics for software testers

Kanij, T., Merkel, R. G. & Grundy, J., 2012, 2012 5th International Workshop on Co-operative and Human Aspects of Software Engineering (CHASE), Proceedings. Sharp, H., Dittrich, Y., de Souza, C. R. B., Cataldo, M. & Hoda, R. (eds.). Piscataway NJ USA: IEEE, Institute of Electrical and Electronics Engineers, p. 63 - 65 3 p.

Research output: Chapter in Book/Report/Conference proceedingConference PaperResearchpeer-review

Towards a better understanding of testing if conditionals

Nath, S. K., Merkel, R. G., Lau, M. F. & Paul, T. K., 2012, Proceedings of the 19th Asia-Pacific Software Engineering Conference. Leung, K. R. P. H. & Muenchaisri, P. (eds.). Los Alamitos CA USA: IEEE, Institute of Electrical and Electronics Engineers, p. 772 - 777 6 p.

Research output: Chapter in Book/Report/Conference proceedingConference PaperResearchpeer-review

2011

An analysis of failure-based test profiles for random testing

Merkel, R., Kuo, F-C. & Chen, T., 2011, Proceedings of the 35th Annual IEEE International Computer Software and Applications Conference. Ahamed, S. I., Minker, W. & Jin, Z. (eds.). Los Alamitos CA USA: IEEE, Institute of Electrical and Electronics Engineers, p. 68 - 75 8 p.

Research output: Chapter in Book/Report/Conference proceedingConference PaperResearchpeer-review

A preliminary study on factors affecting software testing team performance

Kanij, T., Merkel, R. & Grundy, J., 2011, Proceedings of the 2011 fifth International Symposium on Empirical Software Engineering and Measurement (ESEM 2011): 19-23 September, 2011, Banff, Alberta, Canada. Piscataway, NJ: IEEE, Institute of Electrical and Electronics Engineers, p. 359-362 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference PaperResearchpeer-review

Fuzzing the Out-of-Memory Killer on an embedded Linux: An adaptive random approach

Sim, K. Y., Kuo, F-C. & Merkel, R., 2011, Proceedings of the 2011 ACM Symposium on Applied Computing. Shin, D. (ed.). New York NY USA: Association for Computing Machinery (ACM), p. 387 - 392 6 p.

Research output: Chapter in Book/Report/Conference proceedingConference PaperResearchpeer-review

Testing a software-based PID controller using metamorphic testing

Chen, T. Y., Kuo, F-C., Tam, W. K. & Merkel, R. G., 2011, Proceedings of the 1st International Conference on Pervasive and Embedded Computing and Communication Systems. Benavente-Peces, C. & Filipe, J. (eds.). Lisbon Portugal: Scitepress, p. 387 - 396 10 p.

Research output: Chapter in Book/Report/Conference proceedingConference PaperResearchpeer-review

Test reconfiguration for service oriented applications

Cooray, M. B., Hamlyn-Haris, J. H. & Merkel, R., 2011, Proceedings of the 2011 Fourth IEEE International Conference on Utility and Cloud Computing. Buyya, R., Pallickara, S. & Fox, G. (eds.). Los Alamitos CA USA: IEEE, Institute of Electrical and Electronics Engineers, p. 300 - 305 6 p.

Research output: Chapter in Book/Report/Conference proceedingConference PaperResearchpeer-review

2009

Enhanced lattice-based adaptive random testing

Chen, T. Y., Huang, D. H., Kuo, F-C., Merkel, R. G. & Mayer, J., 2009, Proceedings of the 2009 ACM Symposium on Applied Computing. Shin, D. (ed.). New York NY USA: Association for Computing Machinery (ACM), p. 422 - 429 8 p.

Research output: Chapter in Book/Report/Conference proceedingConference PaperResearchpeer-review

Tag-based techniques for black-box test case prioritization for service testing

Mei, L., Chan, W-K., Tse, T. H. & Merkel, R. G., 2009, Proceedings of the 2009 Ninth International Conference on Quality Software. Choi, B. (ed.). Los Alamitos CA USA: IEEE, Institute of Electrical and Electronics Engineers, p. 21 - 30 10 p.

Research output: Chapter in Book/Report/Conference proceedingConference PaperResearchpeer-review

2006

Efficient and effective random testing using the Voronoi diagram

Chen, T. Y. & Merkel, R. G., 2006, Proceedings of the 2006 Australian Software Engineering Conference. Han, J. & Staples, M. (eds.). Los Alamitos CA USA: IEEE Computer Society, p. 300 - 305 6 p.

Research output: Chapter in Book/Report/Conference proceedingConference PaperResearchpeer-review

2005

Quasi-random testing

Chen, T. & Merkel, R., 2005, Proceedings of the 20th IEEE/ACM International Conference on Automated Software Engineering. Ellman, T. & Zisman, A. (eds.). New York NY USA: Association for Computing Machinery (ACM), p. 309 - 312 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference PaperResearchpeer-review

2004

Adaptive random testing through dynamic partitioning

Chen, T., Eddy, G., Merkel, R. & Wong, P. K., 2004, Proceedings of the Fourth International Conference on Quality Software. Ehrich, H-D. & Schewe, K-D. (eds.). Los Alamitos CA USA: IEEE Computer Society, p. 79 - 86 8 p.

Research output: Chapter in Book/Report/Conference proceedingConference PaperResearchpeer-review