Media contributions
1Media contributions
Title FIB-SEM Tomography of Porous Geological Materials Degree of recognition International Media name/outlet Wiley Analytical Science Media type Web Country/Territory Australia Date 19/06/17 Description Focused Ion Beam (FIB) milling capabilities incorporated into a traditional Scanning Electron Microscope (SEM) constitutes a powerful tool for the observation of internal structures at high resolution in biological and materials science, as well as in industry. In recent years its use has been extended to geological samples [1–5], enabling 3D volume analysis with nano-scale resolution providing Earth scientists with unparalleled insights into the complex internal structural and chemical variations that govern the physical properties of geological materials. This short article introduces the application of FIB-SEM into the study of porous geological materials. URL https://analyticalscience.wiley.com/do/10.1002/imaging.5916 Persons Yang Liu, Helen E. King, Pierre Le Fur, Marijn A. Van Huis, Martyn R. Drury, Oliver Plümper