Description
The William H. F. Talbot Award is given to young scientists for exceptional contributions to the advancement of X-ray and Neutron Phase Contrast Imaging, through either their outstanding technical developments or applications, as evidenced by their presentation at the International Conference on X-ray and Neutron Phase Imaging with Gratings and supporting publications.Nominees are qualified if they have performed this work as part of their Ph.D. thesis during the two-year period prior to and including the conference. The topics should be appropriate to the themes of the conference, and the work must be available to the award committee as conference papers, publications, or preprints at the time of nomination. Nominees must have submitted an abstract on their work requesting an oral presentation to the conference. The abstract submission deadline of the conference is also the deadline for submission of nominations for the award.
The Award Committee consists of senior scientists in the field with a broad geographical and scientific representation.
| Period | 2017 → … |
|---|---|
| Work for | Paul Scherrer Institute, Switzerland |
| Degree of Recognition | International |